Chinese representative to participate in the second CIE Conference on Measurement Uncertainty

CIE (CIE) second measurement uncertainty workshop in June 11, 2006 to June 17th in Germany PTB (German Institute of physics and technology, the German national legal metrology testing agency) is located at Braunschweig, 105 delegates from Europe and America, and nearly half of them from Germany, Asia represents mainly from Japan, a representatives of China only Hangzhou Yuanfang Photoelectric Information Co Ltd technical director Mr. Pan Jiangen attended.

The theme of the conference is the study of uncertainty in measurement of luminosity and color (spectral radiation). ISO for the first time in 1993 launched the Measurement Uncertainty Guidelines (GUM), by the national attention and widely adopted in 1995, ISO has launched a revised version, but to thoroughly analyze the measurement process of various uncertain factors, thus scientifically and accurately draw the size of the uncertainty, is a very challenging job in recent years, the science and technology workers on the uncertainty of research, ISO will launch a revised version again in the near future. For the measurement of light and radiation, when the geometry measurement is more complex, more sensitive to the effects of temperature and other environmental factors, but also has the correlation between the spectral and the uncertainty analysis of determination is a difficult problem to experts, and the high level of measurement, it is extremely important.

The meeting of fifteen academic experts were invited to report to the general assembly, including thirteen experts from Europe and the United States, Hangzhou technical director Mr. Pan Jiangen was invited to the distance to the General Assembly on the uncertainty of the academic report of LED measurement report was a lively discussion and praise, on behalf of the United States of NIST on the spot to congratulate him and said China study in LED the measurement has considerable depth. The research on the uncertainty of LED measurement is a challenging field, which is the focus of the international society.

The CIE meeting of experts has achieved fruitful results, CIE will be dedicated to publishing the conference included the papers, and, in the near future to publish a monograph on photometric measurement uncertainty evaluation of technical documents and expression method.

The uncertainty after the end of the meeting, CIE D2 (Second Division) held the annual meeting and the technical committee will discuss the seminar held in Beijing next year's CIE twenty-sixth conference, delegates have said they will try to attend the Beijing conference. During the conference, the German PTB is very hospitable, they are in a very broad mind, showing their new laboratories to the delegates, in the optical radiation measurement laboratory of German PTB new, most of the measuring equipment is the only world tour on behalf of the State Laboratory in the United Kingdom and the United States, France, Japan's optical radiation measurement technology the person in charge of all, the world's leading experts, all of the world's leading laboratory in praise, the German PTB is also an exception, each representative can take pictures, everyone left a lot of valuable information. This not only reflects the generosity of the German PTB, but also reflects the confidence of the German PTB, from their actions and the strength of the German PTB is difficult to be cloned. During the meeting China representatives also with the German PTB and American NIST relevant person in charge of China radiation measurement of the scholars to the possibility that the other party short-term laboratory work, the German PTB and American NIST are welcome to Mr. Pan Jiangen recommended talents about the conditions of the.